The Automated Test Blog

Protocol Aware ATE

I recently presented at a group called the Semiconductor Test Consortium, or STC. There were two subjects of the talk – learnings from PXI and other industry standards and emerging trends in SOC (System On a Chip) and SIP (System In a Package) functional testing. The latter has been the subject of some interesting discussion […]

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Posted in PXI, Automated Test, semiconductor ATE, FPGA | 1 Comment »