Archive for June, 2008
Presentation at VLSI Test Symposium
Thursday, June 5th, 2008I was recently invited to give a talk at the VLSI Test Symposium titled “Migration of PXI Instruments into Semiconductor Test“. The session focused on emerging trends in semiconductor ATE and on work that is currently going on in both vendors consortia, to migrate PXI into semiconductor test applications. The presentation covered the key challenges […]
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