Archive for the 'Automated Test' Category
Trend# 5: Emulation-Based ATE That Improves SoC & SiP Testing
Monday, February 11th, 2008OK, time for the last of my 5 trends in test for 2008:
Emulation-Based ATE That Improves System-on-a-Chip and System-in-a-Package Testing
As semiconductor devices become more complex, the process of testing each part completely with a traditional vector-based methodology is increasingly difficult. Complex systems-on-a-chip (SoCs) and systems-in-a-package (SiPs) require a system-level functional test more closely related to […]
Trend# 3: Growing Popularity of FPGA-Enabled Instrumentation
Monday, January 28th, 2008As I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. My 3rd trend is:
Growing Popularity of FPGA-Enabled Instrumentation
Another area experiencing rapid expansion in the test industry is the increase in system-level tools for field-programmable gate arrays (FPGAs). FPGAs are powerful […]