Archive for the 'National Instruments' Category
Presentation at VLSI Test Symposium
Thursday, June 5th, 2008I was recently invited to give a talk at the VLSI Test Symposium titled “Migration of PXI Instruments into Semiconductor Test“. The session focused on emerging trends in semiconductor ATE and on work that is currently going on in both vendors consortia, to migrate PXI into semiconductor test applications. The presentation covered the key challenges […]
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Trend# 4: The Explosion of Wireless Standards
Tuesday, February 5th, 2008As I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. My 4th trend is:
The Explosion of Wireless Standards
Test engineers are facing new challenges as the use of wireless technolgies is rapidly expanding. This was a hot topic during the recent […]
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