Archive for the 'PXI' Category
Presentation at VLSI Test Symposium
Thursday, June 5th, 2008I was recently invited to give a talk at the VLSI Test Symposium titled “Migration of PXI Instruments into Semiconductor Test“. The session focused on emerging trends in semiconductor ATE and on work that is currently going on in both vendors consortia, to migrate PXI into semiconductor test applications. The presentation covered the key challenges […]
Trend# 5: Emulation-Based ATE That Improves SoC & SiP Testing
Monday, February 11th, 2008OK, time for the last of my 5 trends in test for 2008:
Emulation-Based ATE That Improves System-on-a-Chip and System-in-a-Package Testing
As semiconductor devices become more complex, the process of testing each part completely with a traditional vector-based methodology is increasingly difficult. Complex systems-on-a-chip (SoCs) and systems-in-a-package (SiPs) require a system-level functional test more closely related to […]