Archive for the 'Test Engineer' Category
Trend# 5: Emulation-Based ATE That Improves SoC & SiP Testing
Monday, February 11th, 2008OK, time for the last of my 5 trends in test for 2008:
Emulation-Based ATE That Improves System-on-a-Chip and System-in-a-Package Testing
As semiconductor devices become more complex, the process of testing each part completely with a traditional vector-based methodology is increasingly difficult. Complex systems-on-a-chip (SoCs) and systems-in-a-package (SiPs) require a system-level functional test more closely related to […]
Trend# 4: The Explosion of Wireless Standards
Tuesday, February 5th, 2008As I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. My 4th trend is:
The Explosion of Wireless Standards
Test engineers are facing new challenges as the use of wireless technolgies is rapidly expanding. This was a hot topic during the recent […]