Comments for The Automated Test Blog http://automatedtestblog.com A Discussion of Trends in Test and Measurement Wed, 20 Aug 2008 09:03:54 +0000 http://wordpress.org/?v=2.1 Comment on Protocol Aware ATE by The Automated Test Blog » Blog Archive » Presentation at VLSI Test Symposium http://automatedtestblog.com/2007/11/27/protocol-aware-ate/#comment-552 The Automated Test Blog » Blog Archive » Presentation at VLSI Test Symposium Thu, 05 Jun 2008 13:45:58 +0000 http://automatedtestblog.com/2007/11/27/protocol-aware-ate/#comment-552 [...] engineers that are validating and testing increasingly complex devices such as SoCs and SiPs. As I previously blogged, Protocol Aware ATE is a new technique for testing these complex devices at a system level. In the [...] […] engineers that are validating and testing increasingly complex devices such as SoCs and SiPs. As I previously blogged, Protocol Aware ATE is a new technique for testing these complex devices at a system level. In the […]

]]> Comment on The Impact of Hewlett and Packard by Allen Howard http://automatedtestblog.com/2008/04/20/the-impact-of-hewlett-and-packard/#comment-551 Allen Howard Wed, 04 Jun 2008 18:42:47 +0000 http://automatedtestblog.com/2008/04/20/the-impact-of-hewlett-and-packard/#comment-551 Thanks for the perspective. It's easy to view competitors (or a company that used to be a competitor) in an unfair way. I grew up less than a mile from the HP Printer division in Boise Idaho. Many of my scout leaders and parents of friends worked for HP. I've always respected HP. Sounds like a good book to read. Thanks for the perspective. It’s easy to view competitors (or a company that used to be a competitor) in an unfair way. I grew up less than a mile from the HP Printer division in Boise Idaho. Many of my scout leaders and parents of friends worked for HP. I’ve always respected HP. Sounds like a good book to read.

]]> Comment on Top Test Trends of 2008 by The Automated Test Blog » Blog Archive » Trend# 5: Emulation-Based ATE That Improves SoC & SiP Testing http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-459 The Automated Test Blog » Blog Archive » Trend# 5: Emulation-Based ATE That Improves SoC & SiP Testing Mon, 11 Feb 2008 21:02:39 +0000 http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-459 [...] OK, time for the last of my 5 trends in test for 2008: [...] […] OK, time for the last of my 5 trends in test for 2008: […]

]]> Comment on Trend# 4: The Explosion of Wireless Standards by Wireless News » Blog Archive » Trend# 4: The Explosion of Wireless Standards http://automatedtestblog.com/2008/02/05/trend-4-the-explosion-of-wireless-standards/#comment-452 Wireless News » Blog Archive » Trend# 4: The Explosion of Wireless Standards Sun, 10 Feb 2008 16:30:31 +0000 http://automatedtestblog.com/2008/02/05/trend-4-the-explosion-of-wireless-standards/#comment-452 [...] Original post by Eric Starkloff [...] […] Original post by Eric Starkloff […]

]]> Comment on Engineers learning PXI, RF standards by The Automated Test Blog » Blog Archive » Trend# 4: The Explosion of Wireless Standards http://automatedtestblog.com/2007/09/17/engineers-learning-pxi-rf-standards/#comment-444 The Automated Test Blog » Blog Archive » Trend# 4: The Explosion of Wireless Standards Tue, 05 Feb 2008 18:24:58 +0000 http://automatedtestblog.com/2007/09/17/engineers-learning-pxi-rf-standards/#comment-444 [...] standards. This trend was reflected in the 2007 Test & Measurement World Salary Survey (which I blogged about late last year), in which subscribers across engineering disciplines were asked to identify [...] […] standards. This trend was reflected in the 2007 Test & Measurement World Salary Survey (which I blogged about late last year), in which subscribers across engineering disciplines were asked to identify […]

]]> Comment on Top Test Trends of 2008 by The Automated Test Blog » Blog Archive » Trend# 4: The Explosion of Wireless Standards http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-443 The Automated Test Blog » Blog Archive » Trend# 4: The Explosion of Wireless Standards Tue, 05 Feb 2008 18:16:24 +0000 http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-443 [...] I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. [...] […] I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. […]

]]> Comment on Trend# 3: Growing Popularity of FPGA-Enabled Instrumentation by Anonymous http://automatedtestblog.com/2008/01/28/trend-3-growing-popularity-of-fpga-enabled-instrumentation/#comment-432 Anonymous Tue, 29 Jan 2008 15:07:50 +0000 http://automatedtestblog.com/2008/01/28/trend-3-growing-popularity-of-fpga-enabled-instrumentation/#comment-432 I agree with you that FPGA enabled test- and measurement instruments will be the future. Soon we all build or Spectrym Analyzer by using LabVIEW FPGA on an SDR platform :) I agree with you that FPGA enabled test- and measurement instruments will be the future. Soon we all build or Spectrym Analyzer by using LabVIEW FPGA on an SDR platform :)

]]> Comment on Top Test Trends of 2008 by The Automated Test Blog » Blog Archive » Trend# 3: Growing Popularity of FPGA-Enabled Instrumentation http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-431 The Automated Test Blog » Blog Archive » Trend# 3: Growing Popularity of FPGA-Enabled Instrumentation Mon, 28 Jan 2008 23:35:37 +0000 http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-431 [...] I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. [...] […] I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. […]

]]> Comment on Trend#2: Growth of Software-Defined Instrumentation by Jim Kring http://automatedtestblog.com/2008/01/22/trend2-growth-of-software-defined-instrumentation/#comment-424 Jim Kring Wed, 23 Jan 2008 04:53:16 +0000 http://automatedtestblog.com/2008/01/22/trend2-growth-of-software-defined-instrumentation/#comment-424 Hi Eric, Nice article. I just noticed it after I posted one on my blog called "<a href="http://thinkinging.com/2008/01/22/did-national-instruments-forget-about-virtual-instruments/" rel="nofollow">Did National Instruments forget about Virtual Instruments?</a>". I'm glad to see that there are people inside NI thinking about this. I hope you find my thoughts constructive and useful. Regards, -Jim Hi Eric,

Nice article. I just noticed it after I posted one on my blog called “Did National Instruments forget about Virtual Instruments?“. I’m glad to see that there are people inside NI thinking about this. I hope you find my thoughts constructive and useful.

Regards,

-Jim

]]> Comment on Top Test Trends of 2008 by The Automated Test Blog » Blog Archive » Trend#2: Growth of Software-Defined Instrumentation http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-420 The Automated Test Blog » Blog Archive » Trend#2: Growth of Software-Defined Instrumentation Tue, 22 Jan 2008 19:21:32 +0000 http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/#comment-420 [...] I stated in my last blog, I’m planning to discuss one trend per blog entry over the next few weeks. The second trend in [...] […] I stated in my last blog, I’m planning to discuss one trend per blog entry over the next few weeks. The second trend in […]

]]>