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	<title>The Automated Test Blog</title>
	<link>http://automatedtestblog.com</link>
	<description>A Discussion of Trends in Test and Measurement</description>
	<pubDate>Thu, 05 Jun 2008 14:49:48 +0000</pubDate>
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			<item>
		<title>Presentation at VLSI Test Symposium</title>
		<link>http://automatedtestblog.com/2008/06/05/presentation-at-vlsi-test-symposium/</link>
		<comments>http://automatedtestblog.com/2008/06/05/presentation-at-vlsi-test-symposium/#comments</comments>
		<pubDate>Thu, 05 Jun 2008 13:45:54 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[PXI]]></category>

		<category><![CDATA[National Instruments]]></category>

		<category><![CDATA[semiconductor ATE]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/2008/06/05/presentation-at-vlsi-test-symposium/</guid>
		<description><![CDATA[I was recently invited to give a talk at the VLSI Test Symposium titled &#8220;Migration of PXI Instruments into Semiconductor Test&#8220;. The session focused on emerging trends in semiconductor ATE and on work that is currently going on in both vendors consortia, to migrate PXI into semiconductor test applications. The presentation covered the key challenges [...]]]></description>
			<content:encoded><![CDATA[<p>I was recently invited to give a talk at the <a href="http://www.tttc-vts.org/public_html/new/2008/index.php">VLSI Test Symposium</a> titled &#8220;<a href="http://automatedtestblog.com/wp-content/uploads/2008/06/vts-migration-of-pxi-instruments-into-semiconductor-test.ppt">Migration of PXI Instruments into Semiconductor Test</a>&#8220;. The session focused on emerging trends in semiconductor ATE and on work that is currently going on in both vendors consortia, to migrate <a href="http://pxisa.org/">PXI</a> into semiconductor test applications. The presentation covered the key challenges currently facing engineers that are validating and testing increasingly complex devices such as <a href="http://en.wikipedia.org/wiki/System-on-a-chip">SoCs</a> and <a href="http://en.wikipedia.org/wiki/System_in_package">SiPs</a>. As I <a href="http://automatedtestblog.com/2007/11/27/protocol-aware-ate/">previously blogged</a>, Protocol Aware ATE is a new technique for testing these complex devices at a system level. In the presentation, I also covered existing work to build semiconductor ATE based on <a href="http://pxisa.org/">PXI</a>, including examples of augmenting existing ATE, creating testers with a <a href="http://pxisa.org/">PXI</a> measurement core, and work by the <a href="http://www.semitest.org/home">Semiconductor Test Consortium</a> on a Portable Test Instrument Module, or PTIM. The PTIM initiative is designed to provide a way to add ancillary measurement capability to existing ATE platforms. The STC has been evaluating various options and has the desire to standardize PTIM on an exiting industry standard. <a href="http://pxisa.org/">PXI</a> has been proposed as the PTIM platform and is currently being discussed at the <a href="http://www.semitest.org/events/GSC_2008/">Global STC Conference</a> this week in San Diego. This proposal will enable ATE customers and vendors to leverage the large commercial investment in <a href="http://pxisa.org/">PXI </a>and extend ATE capability by using the 1500 existing <a href="http://pxisa.org/">PXI </a>modules currently available.</p>
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		<title>The Impact of Hewlett and Packard</title>
		<link>http://automatedtestblog.com/2008/04/20/the-impact-of-hewlett-and-packard/</link>
		<comments>http://automatedtestblog.com/2008/04/20/the-impact-of-hewlett-and-packard/#comments</comments>
		<pubDate>Sun, 20 Apr 2008 18:46:54 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Hewlett-Packard]]></category>

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		<description><![CDATA[I just finished reading the book Bill and Dave: How Hewlett and Packard Built the World&#8217;s Greatest Company.  Its a good read that focuses on the personal story of how two engineers built the most successful high technology company of their generation.  Its also a good reminder of how much Hewlett and Packard [...]]]></description>
			<content:encoded><![CDATA[<p>I just finished reading the book <a href="http://www.amazon.com/Bill-Dave-Hewlett-Packard-Greatest/dp/B000VPKFRM/ref=cm_cr_pr_pb_t">Bill and Dave: How Hewlett and Packard Built the World&#8217;s Greatest Company</a>.  Its a good read that focuses on the personal story of how two engineers built the most successful high technology company of their generation.  Its also a good reminder of how much Hewlett and Packard laid the groundwork for the current generation of technology companies.  Among other things, they pioneered &#8220;Flex-time&#8221;, the &#8220;Open Door&#8221; policy, &#8220;Management by Walking Around&#8221;, profit sharing, employee stock purchase plans, casual Fridays, &#8220;10% time&#8221; MBOs, company barbecues, and the cubicle (but don&#8217;t hold that last one against them!).  All of us in the technology field owe a lot to those two pioneers.</p>
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		<title>A Blog on Smog</title>
		<link>http://automatedtestblog.com/2008/03/11/a-blog-on-smog/</link>
		<comments>http://automatedtestblog.com/2008/03/11/a-blog-on-smog/#comments</comments>
		<pubDate>Tue, 11 Mar 2008 14:22:39 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Green Engineering]]></category>

		<category><![CDATA[China]]></category>

		<category><![CDATA[Olympics]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/2008/03/11/a-blog-on-smog/</guid>
		<description><![CDATA[Last week, I was in China for a conference.  The economy continues to boom there; its amazing to see how much has changed since my last trip just two years ago.  The skyline in Shanghai has grown immeasurably, the piracy and knock off brands have been pushed &#8216;underground&#8217; (though, its still pretty easy [...]]]></description>
			<content:encoded><![CDATA[<p>Last week, I was in China for a conference.  The economy continues to boom there; its amazing to see how much has changed since my last trip just two years ago.  The skyline in Shanghai has grown immeasurably, the piracy and knock off brands have been pushed &#8216;underground&#8217; (though, its still pretty easy to get a fake Rolex), and the evidence of China&#8217;s growing middle class is apparent - its almost as easy to get a real Rolex now at the many upscale shops around town.  But one of the most pronounced changes is the growing pollution in Shanghai and Beijing.  I only flew through Beijing, but I couldn&#8217;t even see the terminal from our plane as we taxied in.  As one of my colleagues noted, you could look right at the sun, which was only a soft glow behind the yellow smog.  Shanghai wasn&#8217;t quite as bad, but as we drove into the city, we all noticed our sinuses clogging and a distinct itch in the back of our throats.  Another colleague attempted to take a jog in the city, but gave up after a few blocks.</p>
<p>So that raises the question that everyone has been asking: How is Beijing going to host the world&#8217;s <a href="http://en.beijing2008.cn/">premier athletic competition</a> in a mere few months?  The Chinese have instituted a <a href="http://www.nytimes.com/2007/12/29/world/asia/29china.html">decade long plan</a> to clean up Beijing&#8217;s air, but opinions vary on how well it has worked so far (and my experience last week would suggest that it hasn&#8217;t).  There are also more drastic contingencies planned, such as shutting down factories, restricting automobiles, and even <a href="http://asia.news.yahoo.com/070425/ap/d8onm45g0.html">seeding clouds to force rain</a>, in an effort to &#8220;cleanse the air&#8221;.  Some athlete&#8217;s aren&#8217;t so confident - one of the world&#8217;s premier marathon runners today announced that he<a href="http://news.scotsman.com/latestnews/Beijing-smog-39may-keep-marathon.3862869.jp"> may pull out of the Olympic</a> due to health concerns related to the pollution.</p>
<p>So what&#8217;s the long term solution to the pollution in China and elsewhere around the world?  Probably not restricting traffic or seeding clouds.  The problem will be ultimately solved through consumer demand and engineering innovation, or<a href="http://www.epa.gov/oppt/greenengineering/pubs/whats_ge.html"> green engineering</a> . Consumer demand is what is causing the huge uptick in green products and corporate sustainability plans.  Sure, there is a lot of hype out there (now called &#8220;<a href="http://en.wikipedia.org/wiki/Greenwash">Greenwashing</a>&#8220;), but the net effect of all the focus on environmental sensitivity is a positive one.  Even more sustainable are the discoveries and innovations in the scientific and engineering community.  China&#8217;s pollution, for example, is primarily the result of coal power plants (a new plant opens in China every week to 10 days) and automobiles.  Both of these industries are seeing huge investments in research to fund cleaner, more sustainable alternatives.  The<a href="http://www.ey.com/global/content.nsf/International/Media_-_Press_Release_-_Renewable_Indices_Q2_2007"> global investments in renewable energy reached $100B in 2006</a> and its projected to grow to more than $750B in the next 10 years.  Research abounds in more efficient solar, wind, and even <a href="http://en.wikipedia.org/wiki/Wave_power">wave energy</a> production. There is also a large investment in researching and productizing alternative fuel and zero emissions vehicles.  We don&#8217;t yet know which of these innovations will prove most successful, but innovation, combined with a capitalistic system which rewards it, will ultimately triumph.   Its only a matter of time before these inventions are not just a novelty, but a economically sustainable business delivering zero emissions but also better performance and lower cost of ownership than their fossil fuel predecessors.  It might not be in time for the <a href="http://en.beijing2008.cn/">Beijing Olympics</a>, but hopefully it will be in time to clean the air for the next generation of China&#8217;s urban population.</p>
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		<item>
		<title>The New Wireless Internet</title>
		<link>http://automatedtestblog.com/2008/02/22/the-new-wireless-internet/</link>
		<comments>http://automatedtestblog.com/2008/02/22/the-new-wireless-internet/#comments</comments>
		<pubDate>Fri, 22 Feb 2008 22:55:40 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Wireless]]></category>

		<category><![CDATA[Apple]]></category>

		<category><![CDATA[iPhone]]></category>

		<category><![CDATA[Internet]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/2008/02/22/the-new-wireless-internet/</guid>
		<description><![CDATA[Wireless mobile devices will fundamentally change the way we use and interact with the Internet. As I&#8217;ve posted before, I am a unabashed iPhone user. And I&#8217;ve started to notice some curious things about my use of the Internet now that its with me all the time and easily accessible. For one, my Internet usage [...]]]></description>
			<content:encoded><![CDATA[<p>Wireless mobile devices will fundamentally change the way we use and interact with the Internet. As I&#8217;ve posted before, I am a unabashed <a href="http://www.apple.com/iphone/">iPhone </a>user. And I&#8217;ve started to notice some curious things about my use of the Internet now that its with me all the time and easily accessible. For one, my Internet usage has gone up by an order of magnitude. I don&#8217;t think I&#8217;m exaggerating - I literally mean <em>10x</em>. And let&#8217;s be clear, I was already a heavy Internet user. Now I use it <em>10 times more</em>. This also means I access the Internet on my phone at least 10 times more than I do on my PC. I&#8217;ve grown so accustomed to the device that I find myself surfing the web on it while sitting in front of my laptop. I have also noticed that my expectations for Internet content has changed. For example, my expectation for real time content has gone up dramitically. I check news sites like<a href="http://www.cnn.com"> cnn.com</a> several times each hour and expect news updates. <em>No new headlines in the last 20 minutes? Maybe I should try another site.</em> I also notice that I use the device to augment my own knowledge on the fly by searching acronyms, names, etc., while in conversation or in a meeting. I don&#8217;t think I&#8217;m at all alone in this trend: <a href="http://www.google.com">Google </a><a href="http://www.macworld.co.uk/ipod-itunes/news/index.cfm?RSS&amp;NewsID=20446">recently reported</a> that 50 times more traffic from <a href="http://www.apple.com/iphone/">iPhone </a>users than from other mobile devices. Think about that - <strong><em>50 times</em></strong>! When you make a tool like <a href="http://www.google.com">Google</a> more accessible, dramatic things can happen. I&#8217;ve also talked to several colleagues (<a href="http://www.ni.com">NI</a> has a density of <a href="http://www.apple.com/iphone/">iPhone </a>users that I doubt is topped anywhere outside of <a href="http://en.wikipedia.org/wiki/Cupertino">Cupertino</a>), and they report a similar phenomena.</p>
<p>So, the question is, what is driving this change? I think first and foremost, we&#8217;re starting to really see the impact of ubiquitous wireless connectivity. The <a href="www.apple.com/iphone">iPhone</a> happened to make the full Internet available in way that is as good or better than the experience on the PC. Once the Internet makes the jump to wireless devices, the dynamic of the Internet will really change. The PC will quickly become irrelevant as an Internet device - the number of mobile devices (&gt;1 billion per year) dwarfs the number of PCs (about 250 million per year). As <a href="http://www.eetimes.com/TechSearch/Search.jhtml?site_id=EE+Times&amp;Site+ID=EE+Times&amp;queryText=bolaji+ojo&amp;Search.x=0&amp;Search.y=0&amp;Search=Search">Bolaji Ojo</a> of <a href="http://www.eetimes.com/">EEtimes </a>recently stated in his article <em><a href="http://www.eetimes.com/showArticle.jhtml;jsessionid=LFSCQKRJSSMPQQSNDLPCKHSCJUNN2JVN?articleID=205208620">Wireless is everywhere, ignore it at your peril</a></em>, &#8220;the search is over for the next killer app&#8230;it is wireless&#8221;.</p>
<p>As an extension of my own personal <a href="http://www.apple.com/iphone/">iPhone </a>observations, I think the new wireless Internet will have some of the following attributes:</p>
<ul>
<li>Usage an order of magnitude greater than the current web;</li>
<li>Significantly increased demand for real time information;</li>
<li>A two way communication portal, not just an information source (Web 2.0);</li>
<li>Optimized primarily for mobile devices, not PCs.</li>
</ul>
<p>It will get even more interesting as the wireless data bandwidth explodes with standards such as <a href="http://www.wimaxforum.org/home/">WiMAX </a>and <a href="http://www.3gpp.org/Highlights/LTE/LTE.htm">LTE</a>. 2008 should be a fascinating year for wireless, particularly, the wireless Internet.</p>
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		<title>Trend# 5: Emulation-Based ATE That Improves SoC &#038; SiP Testing</title>
		<link>http://automatedtestblog.com/2008/02/11/trend-5-emulation-based-ate-that-improves-soc-sip-testing/</link>
		<comments>http://automatedtestblog.com/2008/02/11/trend-5-emulation-based-ate-that-improves-soc-sip-testing/#comments</comments>
		<pubDate>Mon, 11 Feb 2008 21:02:37 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[PXI]]></category>

		<category><![CDATA[Automated Test]]></category>

		<category><![CDATA[semiconductor ATE]]></category>

		<category><![CDATA[FPGA]]></category>

		<category><![CDATA[Test Engineer]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/2008/02/11/trend-5-emulation-based-ate-that-improves-soc-sip-testing/</guid>
		<description><![CDATA[OK, time for the last of my 5 trends in test for 2008:
Emulation-Based ATE That Improves System-on-a-Chip and System-in-a-Package Testing
As semiconductor devices become more complex, the process of testing each part completely with a traditional vector-based methodology is increasingly difficult. Complex systems-on-a-chip (SoCs) and systems-in-a-package (SiPs) require a system-level functional test more closely related to [...]]]></description>
			<content:encoded><![CDATA[<p><font size="2" face="Arial"><span style="font-size: 12pt; font-family: 'Georgia','serif'">OK, time for the last of my <a href="http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/">5 trends in test for 2008</a>:</span><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span></font></p>
<p><font size="2" face="Arial"><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span><strong><span style="font-size: 12pt; font-family: 'Georgia','serif'">Emulation-Based ATE That Improves System-on-a-Chip and System-in-a-Package Testing</span></strong><span style="font-size: 12pt; font-family: 'Georgia','serif'"><br />
As semiconductor devices become more complex, the process of testing each part completely with a traditional vector-based methodology is increasingly difficult. Complex </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><a href="http://en.wikipedia.org/wiki/System-on-a-chip"><span style="color: purple">systems-on-a-chip</span></a></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"> (SoCs) and </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><a href="http://en.wikipedia.org/wiki/System_in_package"><span style="color: purple">systems-in-a-package</span></a></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"> (SiPs) require a system-level functional test more closely related to testing components placed on a printed circuit board than a typical chip test, but they still require the high speeds demanded in production test for the semiconductor industry. The strategy of testing a device by emulating actual real-world signals provides a better method of functional test for these types of high-speed systems. This emulation-based ATE, or also termed &#8220;Protocol-Aware ATE&#8221; during last year&#8217;s </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><a href="http://itctestweek.org/"><span style="color: purple">International Test Conference</span></a></span><span style="font-size: 12pt; font-family: 'Georgia','serif'">, combines FPGA-based hardware to emulate the rest of the system in real-time with the pin electronics found in traditional ATE. This lowers the total cost of test through better use-case coverage and improves the user’s ability to debug failures. I explained this idea in more detail in a recent </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><a href="http://automatedtestblog.com/2007/11/27/protocol-aware-ate/"><span style="color: purple">blog post</span></a></span><span style="font-size: 12pt; font-family: 'Georgia','serif'">. In 2008, I expect more vendors to incorporate elements of emulation-based tests into traditional tester architectures and for more users to incoproate platforms currently used in functional test, such as <a href="http://pxisa.org">PXI</a>, into chip validation and test applications. </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span></font></p>
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		<title>Trend# 4: The Explosion of Wireless Standards</title>
		<link>http://automatedtestblog.com/2008/02/05/trend-4-the-explosion-of-wireless-standards/</link>
		<comments>http://automatedtestblog.com/2008/02/05/trend-4-the-explosion-of-wireless-standards/#comments</comments>
		<pubDate>Tue, 05 Feb 2008 18:16:21 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[RF Test]]></category>

		<category><![CDATA[National Instruments]]></category>

		<category><![CDATA[Modular Instruments]]></category>

		<category><![CDATA[Wireless]]></category>

		<category><![CDATA[Apple]]></category>

		<category><![CDATA[Test Engineer]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/2008/02/05/trend-4-the-explosion-of-wireless-standards/</guid>
		<description><![CDATA[As I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. My 4th trend is:

The Explosion of Wireless Standards
Test engineers are facing new challenges as the use of wireless technolgies is rapidly expanding. This was a hot topic during the recent [...]]]></description>
			<content:encoded><![CDATA[<p><font size="3"><font face="Georgia"><span><span style="font-size: 12pt; font-family: 'Georgia','serif'">As I stated in an earlier </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><a href="http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/"><span style="color: purple">blog</span></a></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"> post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. My 4th trend is:</span><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span></span></font></font><font size="3"><font face="Arial"><span></span></font></font><font size="2"><font face="Georgia"><span></span></font></font><font size="2"><font face="Georgia"><span></span></font></font></p>
<p style="margin: 0in 0in 10pt; line-height: 15.6pt" class="MsoNormal"><font size="2"><font face="Arial"><strong><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span></strong></font></font></p>
<p><font size="3"><font face="Georgia"><strong><span style="font-size: 12pt; font-family: 'Georgia','serif'">The Explosion of Wireless Standards</span></strong><span style="font-size: 12pt; font-family: 'Georgia','serif'"><br />
Test engineers are facing new challenges as the use of wireless technolgies is rapidly expanding. This was a hot topic during the recent </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><a href="http://www.cesweb.org/default.asp"><span style="color: purple">CES 2008</span></a></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"> conference. One </span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><a href="http://biz.yahoo.com/ibd/080109/tech.html?.v=1"><span style="color: purple">article</span></a></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"> covering CES, stated “Today&#8217;s young people might be called the wired generation, but judging from this year&#8217;s Consumer Electronics Show they might not have to deal with actual wires for much longer.” Below are few examples of products that have traditionally been “wired”, but are now becoming “wireless” devices:</span></font></font></p>
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<li>
<ul>
<li><font size="3"><font face="Georgia"><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span></font></font><font size="2"><font face="Georgia"><span style="font-family: 'Georgia','serif'"><a href="http://www.apple.com/timecapsule/"><span style="color: purple"><font size="3">Apple Time Capsule</font></span></a><font size="3">, which is a 1 terabyte wireless hard-drive using </font><a href="http://en.wikipedia.org/wiki/IEEE_802.11n"><span style="color: purple"><font size="3">802.11n</font></span></a><font size="3">.</font></span></font></font></li>
<li><font size="2"><font face="Georgia"><span style="font-family: 'Georgia','serif'"></span></font></font><font size="3"><font face="Georgia"><span style="font-family: 'Georgia','serif'"><a href="http://www.pcmag.com/article2/0,1759,2108791,00.asp"><span style="color: purple"><font size="3">GM Vehicle-to-Vehicle technology,</font></span></a><font size="3"> cars are becoming wireless network that can broadcast position, speed, heading to surrounding cars. </font></span></font></font></li>
<li><font size="3"><font face="Georgia"><span style="font-family: 'Georgia','serif'"></span></font></font><font size="3"><font face="Georgia"><span style="font-family: 'Georgia','serif'"><a href="http://video.aol.com/video-detail/samsung-introduces-flat-panel-wireless-tv/1486125417"><span style="color: purple"><font size="3">Samsung flat-panel wireless TV</font></span></a><font size="3">, that receives its data from an 802.11n transmitte</font></span></font></font></li>
</ul>
</li>
</ul>
<p><font size="3"><font face="Georgia"><span><span style="font-size: 12pt; font-family: 'Georgia','serif'">As Wireless transitions from a vertical industry into a horizontal application, more and more test engineers will be faced with the challenge of testing RF wireless capability. Soon, RF instrumentation could become as ubiquitous as general-purpose instruments such as digital multimeters. This growth in adoption requires test engineers to learn wireless protocols and keep pace with the rapid introduction of new standards. This trend was reflected in the <span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="'Georgia'"><a href="http://www.tmworld.com/index.asp?layout=TMWSalary07question&amp;order=28"><span style="color: purple">2007 Test &amp; Measurement World Salary Survey</span></a></font></font></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="'Georgia'"> (which I </font></font></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="'Georgia'"><a href="http://automatedtestblog.com/2007/09/17/engineers-learning-pxi-rf-standards/"><span style="color: purple">blogged</span></a></font></font></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="'Georgia'"> about late last year), in which subscribers across engineering disciplines were asked to identify the top technologies they are being required to learn. Among the top responses were </font></font></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="'Georgia'"><a href="http://en.wikipedia.org/wiki/WLAN"><span style="color: purple">WLAN</span></a></font></font></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="'Georgia'"> and </font></font></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="Georgia"><a href="http://en.wikipedia.org/wiki/WiMAX"><span style="color: purple">WiMax</span></a></font></font></span>.</span></span></font></font><font size="3"><font face="Georgia"><span><span style="font-size: 12pt; font-family: 'Georgia','serif'"><font size="3"><font face="Georgia">An additional challenge as wireless becomes ubiquitous on high volume consumer devices, is that manufacturers must optimize the throughput of test systems. When a low cost music player adds wireless capability, for example, the test system, which now must include RF test equipment, can&#8217;t add significant cost to the  product.  Keeping up with these demands requires an RF platform optimized for throughput and cost.<span style="font-size: 12pt; font-family: 'Georgia','serif'"></span><span style="font-size: 12pt; font-family: 'Georgia','serif'"></span></font></font></p>
<p></span></span></font></font></p>
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