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	<title>The Automated Test Blog</title>
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	<description>A Discussion of Trends in Test and Measurement</description>
	<pubDate>Wed, 02 Sep 2009 18:34:18 +0000</pubDate>
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		<title>Cooperative Innovation</title>
		<link>http://automatedtestblog.com/2009/09/02/cooperative-innovation/</link>
		<comments>http://automatedtestblog.com/2009/09/02/cooperative-innovation/#comments</comments>
		<pubDate>Wed, 02 Sep 2009 18:34:18 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=137</guid>
		<description><![CDATA[I recently published the aforementioned article in Electronic Design titled Cooperate to Innovate.  The premise is that we need to be creative, particularly in tough economic times, to preserve innovation.  One techqnique is to cooperate along non-traditional lines.  For example, I have been working for the last couple of years on a joint developement project [...]]]></description>
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		<title>A Record-Breaking NI Week</title>
		<link>http://automatedtestblog.com/2009/08/12/a-record-breaking-ni-week/</link>
		<comments>http://automatedtestblog.com/2009/08/12/a-record-breaking-ni-week/#comments</comments>
		<pubDate>Wed, 12 Aug 2009 14:38:06 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=135</guid>
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		<title>PXI in Semiconductor Characterization</title>
		<link>http://automatedtestblog.com/2009/05/20/pxi-in-semiconductor-characterization/</link>
		<comments>http://automatedtestblog.com/2009/05/20/pxi-in-semiconductor-characterization/#comments</comments>
		<pubDate>Wed, 20 May 2009 21:52:31 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Automated Test]]></category>

		<category><![CDATA[Industry Trends]]></category>

		<category><![CDATA[characterization]]></category>

		<category><![CDATA[LabVIEW]]></category>

		<category><![CDATA[Protocol-Aware ATE]]></category>

		<category><![CDATA[PXI]]></category>

		<category><![CDATA[Semiconductor]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=129</guid>
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		<title>Innovating in Tough Times</title>
		<link>http://automatedtestblog.com/2009/04/07/innovating-in-tough-times/</link>
		<comments>http://automatedtestblog.com/2009/04/07/innovating-in-tough-times/#comments</comments>
		<pubDate>Tue, 07 Apr 2009 14:21:32 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Industry Trends]]></category>

		<category><![CDATA[innovation]]></category>

		<category><![CDATA[recession]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=126</guid>
		<description><![CDATA[]]></description>
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		<item>
		<title>Creative Market Sizing</title>
		<link>http://automatedtestblog.com/2009/03/19/creative-market-sizing/</link>
		<comments>http://automatedtestblog.com/2009/03/19/creative-market-sizing/#comments</comments>
		<pubDate>Thu, 19 Mar 2009 20:51:06 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Industry Trends]]></category>

		<category><![CDATA[lxi]]></category>

		<category><![CDATA[test and measurement world]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=122</guid>
		<description><![CDATA[]]></description>
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		<title>Trend# 3: Expansion of Wireless and Protocol-Aware Test</title>
		<link>http://automatedtestblog.com/2009/03/02/trend-3-expansion-of-wireless-and-protocol-aware-test/</link>
		<comments>http://automatedtestblog.com/2009/03/02/trend-3-expansion-of-wireless-and-protocol-aware-test/#comments</comments>
		<pubDate>Mon, 02 Mar 2009 20:34:13 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Automated Test]]></category>

		<category><![CDATA[Industry Trends]]></category>

		<category><![CDATA[CAST]]></category>

		<category><![CDATA[gps]]></category>

		<category><![CDATA[gsm]]></category>

		<category><![CDATA[Protocol-Aware ATE]]></category>

		<category><![CDATA[STC]]></category>

		<category><![CDATA[wimax]]></category>

		<category><![CDATA[Wireless]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=117</guid>
		<description><![CDATA[]]></description>
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		<item>
		<title>Trend# 2: Increased Adoption of Parallel Processing Technologies</title>
		<link>http://automatedtestblog.com/2009/02/09/trend-2-increased-adoption-of-parallel-processing-technologies/</link>
		<comments>http://automatedtestblog.com/2009/02/09/trend-2-increased-adoption-of-parallel-processing-technologies/#comments</comments>
		<pubDate>Mon, 09 Feb 2009 23:23:18 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Automated Test]]></category>

		<category><![CDATA[Industry Trends]]></category>

		<category><![CDATA[Technology]]></category>

		<category><![CDATA[FPGA]]></category>

		<category><![CDATA[LabVIEW]]></category>

		<category><![CDATA[Multicore]]></category>

		<category><![CDATA[Parallel Test]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=96</guid>
		<description><![CDATA[]]></description>
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		<item>
		<title>2009 Trends in Test</title>
		<link>http://automatedtestblog.com/2009/01/26/2009-trends-in-test/</link>
		<comments>http://automatedtestblog.com/2009/01/26/2009-trends-in-test/#comments</comments>
		<pubDate>Mon, 26 Jan 2009 02:37:20 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Automated Test]]></category>

		<category><![CDATA[Industry Trends]]></category>

		<category><![CDATA[Technology]]></category>

		<category><![CDATA[software-defined]]></category>

		<category><![CDATA[trends]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=93</guid>
		<description><![CDATA[]]></description>
			<content:encoded><![CDATA[]]></content:encoded>
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		<item>
		<title>A Brave New Year</title>
		<link>http://automatedtestblog.com/2009/01/05/a-brave-new-year/</link>
		<comments>http://automatedtestblog.com/2009/01/05/a-brave-new-year/#comments</comments>
		<pubDate>Mon, 05 Jan 2009 02:54:21 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[News]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=91</guid>
		<description><![CDATA[]]></description>
			<content:encoded><![CDATA[]]></content:encoded>
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		<item>
		<title>Test More with Less</title>
		<link>http://automatedtestblog.com/2008/11/25/test-more-with-less/</link>
		<comments>http://automatedtestblog.com/2008/11/25/test-more-with-less/#comments</comments>
		<pubDate>Tue, 25 Nov 2008 14:15:23 +0000</pubDate>
		<dc:creator>Eric Starkloff</dc:creator>
		
		<category><![CDATA[Automated Test]]></category>

		<category><![CDATA[Industry Trends]]></category>

		<category><![CDATA[News]]></category>

		<category><![CDATA[economy]]></category>

		<guid isPermaLink="false">http://automatedtestblog.com/?p=88</guid>
		<description><![CDATA[]]></description>
			<content:encoded><![CDATA[]]></content:encoded>
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