• We have got to change our values in most of the western world with respect to how we view science and engineering versus other professions.  Dean Kamen of DEKA Research and inventor of the Segway, among many other things, described this crisis most eloquently  and I won’t try to reproduce all of it here.  He did made one comparison that I found particularly instructive, though: he described countries and cultures as going through development much like individuals.  They start life taking risks and learning quickly and over time become more risk-averse and conservative.  In this sense, it is not a coincidence that the US was the great innovator in the world at the beginning of last century; we didn’t have smarter people, we were just willing to take more risks.  Now, that risk taking has moved to other regions.  He did mention that perhaps the set of crisis that currently face us will push us to reevaluate what is ultimately important in our culture and give us a renewed sense of purpose.
• We announced our co-development project with Tektronix on a high bandwidth PXI digitizer.  This project is unique in that it leaverages the strengths of both companies to bring a unique product to the market that neither of us could have done alone.  This got me thinking a lot more about the idea o Cooperative Innovation.  In fact, I’m currently writing a column for Electronic Design on this subject.  Look for it in the next couple of months.
• My kids loved the expo.  As engineers, we all need to do a better job engaging our children and children in general on what we do.  We often mistakenly think that our work is over their heads or will be boring to them.  Instead, creating new things is fascinating to children and we need to encourage this.  Of course, the fact that we had a “Robot Petting Zoo” didn’t hurt, either.
• Most of our community has dated impression of what NI does.  So many of our key customers, after attending their first NI Week, say ” I now have a completely different impression of NI”.  While it remains difficult to explain exactly what it is we do, as a marketer, this lays down a challenge to do a better job presenting our company’s vision to the world.

OK, that’s all I’ve digested for now.  Time to get to work on NI Week 2010.

I found the article particularly inersting as it articulates some common challenges I’ve been seeing in semiconductor characterization that I believe PXI and LabVIEW are very well-suited to solve.  We are, in fact, seeing a major uptick in the use of these platforms in applications such as these.  Another technolgy that I believe will be important in these applications is the user-programmable FPGA.  I discussed this trend in a previous post on Protocol Aware ATE.

1) A large number of LXI instruments already had Ethernet connectivity and then added LXI compliance;

2) Many LXI instruments also have other buses that can be used to connect them to a PC, such as GPIB and USB; and

3) Not all standalong instruments are connected to a PC at all.

Not that these issues are a problem for users – it makes sense to have standards around implementation of Ethernet instruments and it makes sense to give users a choice of connectivity options.  The only problem is that these numbers are positioned this way to influence public opinion; in this case, to imply that the use of LXI is greater then it actually is.  I don’t blame the LXI group for trying, but I do commend Martin Rowe for questioning the report.

Expansion of Wireless and Protocol-Aware Test
In addition to emerging technological advances, software-defined instrumentation has proved ideal for rapid-growth areas such as wireless and protocol-aware test. For example, consumer electronics devices including cell phones and automotive in-dash entertainment systems often integrate multiple communication protocols and standards such as GSM, GPS, and WLAN. Test engineers using traditional instruments rely on vendors to develop dedicated, stand-alone instruments to test each standard. With software-defined instruments, engineers and researchers can test multiple standards using common modular hardware components and implement emerging and custom wireless protocols and algorithms in their test systems regardless of the maturity of a new wireless standard.

For example, Dr. Umberto Spagnolini at the Polytechnic Institute of Milan is using LabVIEW to prototype algorithms for emerging standards such as WiMAX. Researchers such as Dr. Spagnolini can directly control system parameters, including channel coding, power, and modulation scheme, while adding fading and multipath interference to determine system immunity as a prototype of emerging WiMAX algorithms.

In the semiconductor industry, the demand for increasingly functionality and integration continues unabated.  As a result, semiconductor companies are heavily investing in complex systems on a chip (SoCs) and systems in a package (SiPs) technologies. It is often difficult to fully verify these devices using traditional ATE, which has led to an increased demand for so-called protocol aware test or the ability to test devices by emulating the real-world signals connected to them.

These increasing requirements for semiconductor test and the need to reduce total test costs have led industry organizations such as the Semiconductor Test Consortium (STC) and the newly founded Collaborative Alliance for Semiconductor Test (CAST) to investigate standards around open test architectures that support the integration of modular, software-defined instrumentation such as PXI into traditional semiconductor ATE. By using software-defined, FPGA-based instrumentation in these semiconductor test systems, engineers can achieve real-time responses with the standard pin electronics found in traditional ATE, lowering the total cost of test through better use-case coverage and improving the user’s ability to debug failures.

Trend#2: Increased Adoption of Parallel Processing Technologies

Multicore technology has become a standard feature in automated test systems and a necessity for today’s electronic devices that are processing unprecedented amounts of data. Software-defined instrumentation takes advantage of the latest multicore processors and high-speed bus technologies to generate, capture, analyze and process the gigabytes of data required to properly design and test electronic devices. Multicore architectures can present a challenge when used with traditional text-based programming environments that are not inherently parallel and require low-level programming techniques. However, test engineers quickly can realize the benefits of multicore technology through inherently higher level programming environments such as LabVIEW, which automatically distributes multithreaded applications across multiple computing cores for maximum performance and throughput.

Many test engineers I talk to are already experiencing the challenge of programming multicore in that, for the first time, they are not seeing an increase in test system performance when updating the PC in the system. In fact, due to the potentially slower clock rates of many multicore processors, their systems may actually run slower!

On the other hand, Alejandro Torres, senior manufacturing test engineer at Sanmina-SCI, provided an example of the potential business benefits attained by using programming tools tuned for multicore technology when he stated, “By leveraging the multicore technology in LabVIEW and the latest NI multicore PXI embedded controller, we were able to increase our test throughput by one additional workday per week. Best of all, we achieved this throughput increase by simply upgrading from a previous-generation PXI single-core embedded controller to the latest NI PXI multicore embedded controller with only minimal changes to our code.”

Another area of growth for software-defined instrumentation is the increase in system-level design tools for FPGAs. Many modular instruments now come equipped with FPGAs, including several released in the past year that offer the high-performance Xilinx Virtex-5 FPGA. These FPGA-based instruments provide test engineers with the ability to implement more complex digital signal processing at faster rates than ever before. Because software programs such as LabVIEW give test engineers the ability to program FPGAs without requiring knowledge of VHDL, the performance benefits of FPGAs are no longer limited to a subset of hardware engineers with extensive knowledge in digital design.

Next week, I’ll post on the third trend, the Expansion of Wireless and Protocol-Aware Test.

These demands have led to three major trends that I believe will significantly influence the Test and Measurement industry over the next year. Instead of blogging them all here today, I will share one per entry over the next few weeks.

Trend#1: Growth of Software-Defined Instrumentation

The adoption of software-defined instrumentation is the most significant trend in test and measurement for 2009. Software-defined instruments, also known as virtual instruments, consist of modular hardware and user-defined software that give engineers the ability to combine standard and user-defined measurements with custom data processing using common hardware components. This flexibility has become critical as electronic devices such as next-generation navigation systems and smart phones integrate diverse capabilities and rapidly adopt new communication standards. Using software-defined instruments, engineers rapidly can reconfigure their test equipment by modifying software algorithms to meet changing test requirements.

In addition, engineers are using software-defined instrumentation to achieve new levels of measurement performance and lower test costs by applying the latest technological advancements such as multicore processors and field-programmable gate arrays (FPGAs) in their test systems to meet the demands of new application areas such as wireless and protocol-aware test.

Because of the flexibility and cost-effectiveness of this approach, thousands of companies are adopting software-defined instrumentation and industry standards that build on this approach continue to grow, even in the difficult world economy.  For example, according to the PXI Systems Alliance, more than 100,000 PXI systems will be deployed by the end of 2009, and the number of deployed PXI systems is expected to double in the next decade.

Jessy Cavazos, test and measurement industry manager at Frost & Sullivan, recently confirmed that PXI is influencing this trend when she stated, “The open, modular architecture of software-defined instruments such as those in PXI have proven beneficial to a wide range of industries, and, as a result, PXI revenue in measurement and automation is expected to grow at 17.6 percent CAGR through 2014. The performance delivered by the PXI platform has successfully addressed areas such as RF applications in radar testing, mobile phone testing and other wireless applications that were previously impossible to address with other instrumentation.”

Next week, I’ll post on the second trend, the increased adotoption of parallel technologies.

Testing more with less means that you may have to reevaluate your approach to test, and indeed, it is in disruptive conditions such as we now face that new ideas are the most prone to take hold. I believe that modular, software defined test systems provide the greatest opportunity for testing more with less – regardless of the dimension where optimization is needed. For example, optimizing the test speed of a production system is often the best path to decreasing test costs. For other applications, reconfiguring a single tester to test multiple devices yields the best results. And in very complex testers, the capital cost may the focus for cost reduction. For each of these situations, and in many others, the software-defined approach has proven time and time again to deliver dramatic improvements.

Let me share a few examples. In a production system, time is, quite literally, money. If you can reduce test time by ½, then you may be able to put half the number of testers at the end of a line. Wireless devices, in particular, are often expensive and time consuming to test. Many cellular phones are still tested with a inefficient method called “call-processing”. In this approach, a device called a “one-box tester” is used to actually simulate a phone call to the device under test. Bringing a phone up into a call is slow and is unnecessary to test if the device is correctly assembled. This would be like testing a television by watching a movie on it, instead of simply sending it a test pattern and verifying the result. More and more cellular handset manufacturers are moving to a software-defined test system that instead tests the physical layer signal of the device and uses signal processing in software to perform the necessary tests to verify each type of wireless standard. This technique is often 2-5 times faster than call-processing, which results in huge savings for the manufacturer.

Another example of achieving cost savings with a modular, software-defined approach is to use the flexibility of software to reconfigure a system to test many different types of devices. Another challenge in wireless test is that many devices have multiple wireless standards. My beloved iPhone, for example, now has 5 radios! Often, these different standards have required different instruments with their own vendor-defined measurement routines. A software-defined system can be reconfigured to test each standard with the same hardware. And when standards inevitably change and evolve, a software-defined system is in a much better position to be able to react to these changes.

A final example is in semiconductor ATE. Many semiconductor devices are tested on so-called “Big iron” testers. These testers have the sophisticated digital infrastructure and pin-electronics to test high performance semiconductors such as processors and SOCs. For simpler devices with low target prices, such as a MEMs sensor or an RFID, however, these testers may be overkill. Because they have the infrastructure to support high performance, it is difficult to scale them to these simpler requirements. A modular, open system such as PXI, though, has a very low entry cost and can be configured with only the minimum required capability, which results in lower capital expenditure.

So, in these turbulent economic times, it will be up to test engineers to innovate using the latest technology to meet the challenges of testing more with less. And those companies and individuals that do this the best will be able to come out of this difficult time stronger than before and ready to take advantage of new opportunities as conditions improve.