http://automatedtestblog.com A Discussion of Trends in Test and Measurement Thu, 05 Jun 2008 14:49:48 +0000 http://backend.userland.com/rss092 en I was recently invited to give a talk at the VLSI Test Symposium titled "Migration of PXI Instruments into Semiconductor Test". The session focused on emerging trends in semiconductor ATE and on work that is currently going on in both vendors consortia, to migrate PXI into semiconductor test applications. The ... http://automatedtestblog.com/2008/06/05/presentation-at-vlsi-test-symposium/ I just finished reading the book Bill and Dave: How Hewlett and Packard Built the World's Greatest Company. Its a good read that focuses on the personal story of how two engineers built the most successful high technology company of their generation. Its also a good reminder of ... http://automatedtestblog.com/2008/04/20/the-impact-of-hewlett-and-packard/ Last week, I was in China for a conference. The economy continues to boom there; its amazing to see how much has changed since my last trip just two years ago. The skyline in Shanghai has grown immeasurably, the piracy and knock off brands have been pushed 'underground' ... http://automatedtestblog.com/2008/03/11/a-blog-on-smog/ Wireless mobile devices will fundamentally change the way we use and interact with the Internet. As I've posted before, I am a unabashed iPhone user. And I've started to notice some curious things about my use of the Internet now that its with me all the time and easily accessible. ... http://automatedtestblog.com/2008/02/22/the-new-wireless-internet/ OK, time for the last of my 5 trends in test for 2008: Emulation-Based ATE That Improves System-on-a-Chip and System-in-a-Package Testing As semiconductor devices become more complex, the process of testing each part completely with a traditional vector-based methodology is increasingly difficult. Complex systems-on-a-chip (SoCs) and systems-in-a-package (SiPs) require a system-level functional ... http://automatedtestblog.com/2008/02/11/trend-5-emulation-based-ate-that-improves-soc-sip-testing/ As I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. My 4th trend is: The Explosion of Wireless Standards Test engineers are facing new challenges as the use of wireless technolgies is rapidly expanding. This was a ... http://automatedtestblog.com/2008/02/05/trend-4-the-explosion-of-wireless-standards/ As I stated in an earlier blog post, I’m planning to discuss one of five industry trends per blog entry over the next few weeks. My 3rd trend is: Growing Popularity of FPGA-Enabled Instrumentation Another area experiencing rapid expansion in the test industry is the increase in system-level tools for field-programmable gate ... http://automatedtestblog.com/2008/01/28/trend-3-growing-popularity-of-fpga-enabled-instrumentation/ As I stated in my last blog, I’m planning to discuss one trend per blog entry over the next few weeks. The second trend in Test and Measurement is: Growth of Software-Defined Instrumentation One issue facing test engineers is that test instrumentation is not updated as rapidly as the devices being tested. ... http://automatedtestblog.com/2008/01/22/trend2-growth-of-software-defined-instrumentation/ This is the time of the year where you see a lot of people making their predictions on the hot trends in 2008 and beyond. Of course, as the old joke goes, predictions are hard, especially the ones about the future. But, anyway, here goes. Since my company serves a very ... http://automatedtestblog.com/2008/01/14/top-test-trends-of-2008/ My friend and colleague Ian Bell, Marketing Manager of our UK office, has started a blog as part of the publication Electronics Weekly. I, of course, welcome him to the blogging community. In merely his third blog, however, Ian has picked a fight with me. Not intentionally, of course. He ... http://automatedtestblog.com/2007/12/05/let-the-blog-wars-begin/